2012 NSLS/CFN Joint Users' Meeting

Workshop 2: Unique Tools for Energy Research: Chemical Analysis of Nanostructures using Electron Energy Loss Spectroscopy (EELS) and Energy-Dispersive X-ray Spectroscopy (EDS) (Part II)

Date: Tuesday, May 22, 2012

Organizer(s): Fernando Camino, CFN/BNL, fcamino@bnl.gov; Dong Su, CFN/BNL, dsu@bnl.gov

Location: CFN, Bldg. 735, Large Conference Rm.

Description: EELS and EDS are powerful and somewhat complementary techniques for the investigation of chemical composition and electronic properties of a wide class of materials and interfaces. In this workshop, which is divided in talks and hands-on (lab) sessions, experts in EELS and EDS will present important results obtained with these techniques in the study of energy-related materials, such as solar cells and batteries. Also, a group of technical talks will discuss the effective use of EDS in both scanning and transmission electron microscopes. Finally, a very important part of the workshop consists of hands-on sessions in five state-of-the-art TEMs and SEMs. In these lab sessions, both beginners and experienced participants will have the opportunity to learn and share practical aspects of these valuable techniques.


StartsEndsList of Speakers
12:30 PM1:30 PM Lunch *, -
Berkner Hall
1:30 PM2:10 PM Nestor Zaluzec, Argonne National Laboratory
"Pushing the Limits of XEDS and EELS Spectroscopy in the Analytical Electron Microscope: Current Technology and Future Prospects"
2:10 PM2:50 PM Fred Cosandey, Rutgers University
“Valence and Chemical Determination of Li-Battery Using EELS”
2:50 PM3:30 PM Nan Jiang, Arizona State University
“EELS Studies of Materials for Solar Power and Solid-State Battery Applications”
3:30 PM3:50 PM Coffee Break, -
3:50 PM4:30 PM Richard McLaughlin, Oxford Instruments
"Challenges and Considerations for EDS Analysis of Nanostructures"
4:30 PM5:10 PM Neil Rowlands, Oxford Instruments
"Factors Affecting Quantitative EDS Analysis in the TEM"
5:10 PM5:30 PM Important Announcements, -
5:30 PM  Workshop Adjourns, -