NSLS-II   |   CFN   |   Brookhaven National Laboratory

Workshop 2: Spectro-microscopy at the Nanoscale: Exploring Chemical, Electronic and Magnetic Properties of Novel Materials

Date: Monday, May 15, 2017

Organizer(s): Ruud Tromp, rtromp@us.ibm.com (IBM TJ Watson Research Center), Elio Vescovo, vescovo@bnl.gov (NSLS-II, BNL), Jurek Sadowski, sadowski@bnl.gov (CFN, BNL)

Location: Center for Functional Nanomaterials (CFN), Bldg. 735, Large Conference Room

Description:

Synchrotron-based spectro-microscopies, such as x-ray photoemission electron microscopy (XPEEM) and high-resolution angle-resolved photoemission spectroscopy (ARPES) are powerful methods for studying chemical, electronic, and magnetic properties of materials.  As new facilities, including the NSLS-II Electron Spectro-Microscopy (ESM) beamline, are coming online, they offer expanded capabilities for spectroscopic characterization of surfaces at nanometer scale.  These new instruments and recent developments in k-space imaging/momentum microscopy generate increased interest in the science community.  It opens new opportunities, but also creates new challenges in further technique development, as well as in the multi-dimensional, multi-set data acquisition and analysis.  This workshop aims to bring together experts in the field of electron spectro-microscopy to explore these perspectives and challenges, spanning from new experimental capabilities for spectro-microscopic characterization of emerging materials, new spin filters and detectors, to the theory of electron optics.

StartsEndsList of Speakers
8:30 AM8:40 AM
Welcoming Remarks (Continental Breakfast - included)
8:40 AM9:25 AM L. Andrew Wray, New York University
New Frontiers for Spectromicroscopy with RIXS and ARPES
9:25 AM10:10 AM Konstantine Kaznatcheev, Brookhaven National Laboratory
ARI – a nano ARPES/ RIXS Facility at NSLS-II
10:10 AM10:30 AM
Coffee Break (included)
10:30 AM11:15 AM Eli Rotenberg, Lawrence Berkeley National Laboratory
ARPES at 120 nm: First Results of nanoARPES at the New MAESTRO Beamline at ALS
11:15 AM12:00 PM Gerd Schoenhense, Univ. of Mainz, Germany
Measuring Electronic Structure in 4 Dimensions – A New Approach to Photoemission
12:00 PM1:00 PM
Lunch (included)
1:00 PM2:00 PM
Tour of the Electron Spectro-Microscopy (ESM) Beamline
2:00 PM2:45 PM Thomas Allison, Stony Brook University
A High Brightness Laser-based Light Source for Time-resolved Extreme Ultraviolet Photoemission Studies
2:45 PM3:30 PM Ruud Tromp, IBM TJ Watson Research Center
Spectroscopy with the Low Energy Electron Microscope
3:30 PM4:00 PM
Coffee Break (included) and Group Photo
4:00 PM4:45 PM Hendrik Ohldag, SLAC National Accelerator Laboratory
Ultrafast and Very Small: Discover Nanoscale Magnetism With Picosecond Time Resolution Using X-Rays
4:45 PM5:30 PM Armin Kleibert, Paul Scherrer Insitut
Magnetism at the Nanoscale Studied using X-PEEM at the Swiss Light Source
5:30 PM 
Workshop Adjourns
  
Workshop 2 Summary