NSLS-II   |   CFN   |   Brookhaven National Laboratory

Workshop 6: Polarized Resonant Soft X-ray Scattering at the NSLS-II

Date: Wednesday, May 17, 2017

Organizer(s): Eliot Gann, eliot.gann@nist.gov (NIST), Dan Fischer, dfischer@bnl.gov (NIST), Dean DeLongchamp, dean.delongchamp@nist.gov (NIST)

Location: Berkner Hall, Bldg. 488, Conference Room B

Description:

Polarized Resonant Soft X-ray Scattering is an exciting new capability which will soon be coming to NSLS-II.  NIST has secured funding to build an P/RSoXS station as part of NIST's suite of beamlines (at SST).  RSoXS provides a few key advantages over more established hard X-ray scattering.  In particular the use of energies between 100-2000 eV allows probing of K and L edges of many low-z materials which have exceedingly low contrast at higher energies.  Thin film relevant systems with thicknesses of several to several hundred nanometers can be examined, while a continually variable contrast can pick out material-specific morphology.  It will be vitally important to get some key current and potential users of the technique together to discuss the early successes and areas for expansion particularly new sample environments and the detailed use of polarization dependence.  Particular focus will be on areas where a new beamline can expand upon the capabilities of existing facilities.

StartsEndsList of Speakers
8:30 AM 
Continental Breakfast (included)
8:30 AM8:40 AM Eliot Gann, Dean DeLongchamp and Dan Fischer, BNL / NIST
Welcoming Remarks and Beamline Design Overview
8:40 AM8:55 AM Cheng Wang, Lawrence Berkeley National Laboratory
Multimodal Resonant X-ray Scattering for Energy Materials at ALS
8:55 AM9:10 AM Ronald Jones, National Institute of Standards & Technology
Using Manufacturing Customers to Drive Innovation, Impact, and Funding of Neutron and X-ray User Facilities
9:10 AM9:25 AM Long Ye, North Carolina State University
Critical Factors that Affect Complex Morphology and Performance Metrics in High-efficiency Nonfullerene Organic Solar Cells
9:25 AM9:40 AM Eunhee Lim, University of California, Santa Barbara
Understanding Electrical Conductivity in Semiconducting Polymers through Resonant Soft X-ray Scattering
9:40 AM9:55 AM Enrique Gomez, The Pennsylvania State University
Resonant Soft X-ray Scattering of Biological Systems
9:55 AM10:10 AM Brian Collins, Washington State University
Developing Optical Models for Resonant X-ray Scattering to Move Toward Quantitative Measurements of Nanostructure
10:10 AM10:40 AM
Coffee Break (included) and Group Photo
10:40 AM10:55 AM Jeffrey Kortright, Lawrence Berkeley National Laboratory
Oxygen K Edge Scattering from Bulk Comb Diblock Copolymer: Extended, Ordered Backbones above the Lamellar Order-Disorder Transition
10:55 AM11:10 AM Alexander Hexemer, Lawrence Berkeley National Laboratory
Strategies for Multi-Modal Analysis
11:10 AM11:25 AM Joseph Kline, National Institute of Standards & Technology
Resonant Soft X-ray Scattering for Block Copolymer Lithography
11:25 AM11:40 AM Daniel Sunday, National Institute of Standards & Technology
Soft X-ray Reflectivity for Quantifying the Chemical Distribution in Thin Films
11:40 AM11:55 AM Nicholas Bedford, Air Force Research Laboratory
Optimization of Human-Performance Biosensors: Opportunities in RSoXS and NEXAFS to Elucidate Biomolecular Structure/Function Relationships for Future Sensor Design
11:55 AM12:30 PM Dean DeLongchamp and Eliot Gann, NIST
Workshop Closing Discussion
12:00 PM 
Lunch (included)
1:00 PM3:00 PM
Beamline Tour and further discussion
  
Workshop 6 Summary